SB-100PY Semiconductor wafer Inspection Lamp

• For fast non-destructive detection of particulate matter as small as 10 microns
• Efficiently detects contamination early in manufacturing, saving valuable production time and unnecessary expense
• The 100-watt bulb emits strong mercury lines at 546, 577 and 579nm
• A special yellow filter blocks the emission of wavelengths shorter than 50nm, protecting against activation of the photoresist

SB-100PY

• Equipped with your choice of two bulbs, each with a rated life of 5,000 hours: the spot bulb provides a concentrated beam of light, while the flood produces a broader, lower-intensity beam
• Unique impact-resistant and dent-proof housing made of a super-tough engineering polymer
• Flexible silicone rubber filter lens holder allows quick and easy bulb replacement without tools!

SPECIFICATIONS

SB-100PY

Voltage Requirements

120, 230, 240, and 100V versions

Bulb Rating

100 watts

Operation

5-minute warm-up time

Lamp Head Diameter
   x Length of Housing

6 1/2" (16.5cm) x 7 1/2" (19cm)

Weight

2 1/2 lbs (1.1kg); 11 1/2 lbs (5.2kg) with transformer base

Cord Length

Two 8 ft (2.5m)
Optional: 20 ft (6m)